Speaker
Keith Riles
(University of Michigan)
Description
Recent progress in tracker alignment R&D at Michigan will be reported.
Dual-laser frequency scanning interferometery (FSI) has proven to work
well in reducing systematic uncertainties due to temperature
fluctuations which limit single-laser FSI measurements under realistic
detector conditions. Results of several recent tests carried out to
cross-check the precision of the dual-laser method will be presented.
Exploratory work to miniaturize the FSI optical components will also
be discussed.
