LC Vertex Detector Workshop 2017

Test-beam analysis and TCAD simulations for capacitively coupled HV-CMOS sensors

2 May 2017, 12:00

30m

Seminar Room (Ringberg Castle, Tegernsee, Germany)

Technologies II

Speaker

Matthew Daniel Buckland (University of Liverpool (GB))

Presentation materials

MBuckland_LCVertexWorkshop_02-05-17.pdf