Speaker
Rongli Geng
(Jefferson Lab)
Description
The Kyoto-KEK sX mapping system was applied to the vertical testing of a 805 MHz 6-cell SNS high-beta cavity (HB60) aimed at localizing field emitters in the cavity. The test result will be presented and implication to the on-going effort in the battle against field emission in current and future SRF cavities will be discussed.
