Speaker
Rongli Geng
(Jefferson Lab)
Description
The Kyoto-KEK sX mapping system was applied to the vertical testing of a 805 MHz 6-cell SNS high-beta cavity (HB60) aimed at localizing field emitters in the cavity. The test result will be presented and implication to the on-going effort in the battle against field emission in current and future SRF cavities will be discussed.
Primary authors
Dr
Paolo Pizzol
(ORNL)
Rongli Geng
(Jefferson Lab)
Yoshihisa Iwashita
(Kyoto U.)
