Speaker
Eric Viklund
(KEK)
Description
The vertical test (VT) stand at the KEK Superconducting RF Testing Facility (STF) currently uses an analog RF control system. We are in the process of replacing this system with a new digital LLRF system based on the MicroTCA.4 architecture. The digital system also allows for greater flexibility regarding configurability and software automation. It is our goal to automate the VT process to improve measurement repeatability, reliability, and speed. We have implemented an automated identification of multi-cell (3 and 9-cell) cavity passband modes. We also develop a software suite to configure the LLRF system via EPICS. This software is used to automatically measure the quality factor and accelerating gradient of cavities during VT.
Author
Eric Viklund
(KEK)
Co-authors
Dr
Mathieu Omet
(High Energy Accelerator Research Organization (KEK))
Kensei Umemori
(KEK)